How do I extract a nonlinear transistor model from measured S-parameters and DC IV curves?
Nonlinear Model Extraction
Nonlinear model extraction is a critical skill in MMIC design. The model quality directly determines whether the simulated PA/LNA/mixer performance matches the fabricated hardware.
- Performance verification: confirm specifications against the application requirements before finalizing the design
- Environmental factors: temperature range, humidity, and vibration affect long-term reliability and parameter drift
- Cost vs. performance: evaluate whether the application demands premium components or standard commercial grades
- Interface compatibility: verify impedance, connector type, and mechanical form factor match the system architecture
- Margin allocation: include sufficient design margin to account for manufacturing tolerances and aging effects
Frequently Asked Questions
How many bias points do I need for extraction?
Minimum: a 5×5 grid (5 V_GS values × 5 V_DS values = 25 bias points). This covers: V_GS from below V_th to above the max operating V_GS. V_DS from 0 to the maximum operating V_DS. Recommended: 7×7 to 10×10 grid (49-100 bias points). More points = better capture of the nonlinear behavior at the transitions (near pinch-off, near saturation). For each bias point: measure S-parameters from 0.1 GHz to at least 2× the operating frequency (e.g., 0.1-67 GHz for a 28 GHz PA). The frequency range must exceed the operating frequency to capture the frequency dependence of the intrinsic elements.
What if I do not have access to on-wafer measurements?
If the device is packaged (not bare die): (1) Measure the packaged device S-parameters on a test fixture (PCB with connectorized access). (2) De-embed the fixture (using TRL calibration or a known fixture model). (3) The de-embedded S-parameters include both the device and the package parasitics. (4) Extract the package model first (from measurements of an empty package or from the package datasheet). (5) De-embed the package to obtain the die-level S-parameters. (6) Proceed with the standard extraction flow. Alternatively: if the device manufacturer provides a nonlinear model: use it directly. Verify by comparing the model S-parameters with your measured packaged-device S-parameters (including the package model). If they agree within 1-2 dB: the model is trustworthy.
How do I verify the model before taping out a MMIC?
Verification steps: (1) S-parameter comparison: overlay the model S-parameters with the measured S-parameters at 5-10 bias points NOT used in the extraction. The agreement should be within: |S11|: ±1 dB, |S21|: ±0.5 dB, |S22|: ±1 dB, phase of S21: ±5°, for all frequencies up to 2× the operating frequency. (2) Large-signal verification: if load-pull data is available: compare the model load-pull contours (P_out, PAE, gain vs load impedance) with measured load-pull. The optimal load impedance should agree within ±2° on the Smith chart. P_out and PAE should agree within ±0.5 dB and ±3%, respectively. (3) Harmonic verification: measure the second and third harmonic output power vs input power. The model should predict the harmonic levels within ±3 dB. If the large-signal verification fails: the model may have issues with the nonlinear current source or charge model. Refit those parameters using the large-signal data as additional optimization targets.