What is a fan-out wafer level package and how is it used for RF applications?
Fan-Out Wafer Level Packaging for RF
FOWLP has transformed the RF module industry by enabling integration density and package miniaturization that was previously impossible with traditional laminate-based packaging. The technology was pioneered by Infineon's eWLB (embedded Wafer Level Ball grid array) and has been adopted by all major RF semiconductor companies.
- Performance verification: confirm specifications against the application requirements before finalizing the design
- Environmental factors: temperature range, humidity, and vibration affect long-term reliability and parameter drift
- Cost vs. performance: evaluate whether the application demands premium components or standard commercial grades
Frequently Asked Questions
How many die can be integrated in one FOWLP?
Current FOWLP technology integrates 2-5 die in a single package for most RF applications. High-end smartphone RF front-end modules integrate up to 7-10 die (PA die, switch die, filter die, control die) plus passive components in a single FOWLP. The limit is set by the reconstituted wafer area allocated to each package and the RDL routing complexity. Larger packages with more die are possible but increase cost and reduce package yield.
What is the cost of FOWLP versus traditional packaging?
At high volume (>10M units/year), FOWLP cost per package is competitive with or lower than laminate-based packages because it eliminates the substrate (the largest cost component of traditional packages). At lower volumes, FOWLP is more expensive due to the reconstitution process overhead. The crossover volume is typically 1-5M units/year, below which traditional laminate packaging is more cost-effective.
What frequencies can FOWLP support?
FOWLP supports RF operation up to approximately 40-60 GHz with current RDL technology. For 5G mmW applications at 28 GHz and 39 GHz, FOWLP with integrated antennas (antenna-in-package, AiP) is used extensively. At 60+ GHz, the RDL line width and dielectric loss become critical design parameters, and advanced RDL processes with low-loss dielectrics are needed.