How do I create a test plan for validating the performance of an RF subsystem?

Creating a test plan for an RF subsystem requires defining: (1) Test objectives: what performance parameters must be validated (gain, noise figure, P1dB, IP3, frequency response, VSWR, spurious emissions, phase noise, EVM). (2) Test configuration: block diagram showing the device under test (DUT), test equipment connections, cable/adapter loss budget, calibration planes, and reference standards. (3) Test sequence: ordered list of measurements from least-risk to most-risk (start with DC checks, then small-signal S-parameters, then large-signal performance, then stress/environmental tests). (4) Pass/fail criteria: derived from the system specification with appropriate test margin. If the system requires NF < 3.0 dB, the component-level specification should be NF < 2.5 dB (0.5 dB margin for measurement uncertainty and system integration losses). (5) Equipment list: VNA (Keysight PNA-X, R&S ZNA for S-parameters and noise figure), signal generator (for CW and modulated stimulus), spectrum analyzer (for spurious and intermodulation), power meter (for absolute power calibration), and environmental chamber (for temperature testing). (6) Calibration requirements: VNA calibration method (SOLT, TRL, ECal), calibration frequency range, and verification with a known standard (check standard, golden unit). (7) Data recording: template for recording measured values, serial numbers, date, temperature, and operator. (8) Risk assessment: identify measurements that could damage the DUT (maximum input power, reverse bias) and include protective measures (attenuators, DC blocks, current limiters).