COB
Understanding COB Assembly
As operating frequencies push into the mmWave range (above 24 GHz), the IC package increasingly becomes the performance bottleneck rather than the silicon or GaAs die itself. A state-of-the-art GaN PA die may provide 20 dB gain at 28 GHz, but packaging it in a standard QFN adds 1 to 2 nH of lead inductance and 0.3 pF of parasitic capacitance per RF pin, reducing gain by 3 to 5 dB and degrading return loss from -20 dB to -8 dB. COB bypasses this problem entirely: the bare die is epoxied directly to the substrate and connected to the circuit traces using short wire bonds (0.3 to 1 mm) or flip-chip solder bumps (50 to 100 μm), preserving the die-level performance through the assembly step.
The trade-off is manufacturing complexity. Packaged ICs are tested before assembly (known good die), can be placed by standard pick-and-place machines at rates of 10,000+ per hour, and are protected by the package from mechanical damage and moisture. COB requires bare die procurement (not all foundries sell bare die), specialized die attach equipment (eutectic or epoxy die bonder with ±5 μm accuracy), wire bonding machines (25 μm gold or aluminum wire, ball-wedge or wedge-wedge), and encapsulation or hermetic sealing. These processes are slower and more expensive per unit than packaged IC assembly, limiting COB to military/aerospace, satellite, low-volume mmWave, and phased array applications where performance justifies the cost premium.
COB vs Packaged IC Parameters
L ≈ 1 nH/mm × length
Flip-Chip Bump Parasitic:
L ≈ 10 to 50 pH, C ≈ 10 to 30 fF per bump
Thermal Resistance (direct attach):
Rth = t/(k × A) (K/W)
Where t = die attach thickness (10 to 50 μm), k = thermal conductivity (1 to 200 W/mK), A = die area. AuSn solder (k=57 W/mK), 25 μm thick, 2×2 mm die: Rth = 0.11 K/W at the attach alone.
COB Assembly Comparison
| Parameter | QFN Package | COB Wire Bond | COB Flip-Chip |
|---|---|---|---|
| Lead inductance | 0.5 to 2 nH | 0.3 to 0.7 nH | 10 to 50 pH |
| Pad capacitance | 0.1 to 0.5 pF | 0.05 to 0.2 pF | 10 to 30 fF |
| Thermal Rth | 15 to 40 K/W | 5 to 15 K/W | 3 to 10 K/W |
| Max frequency | 20 to 40 GHz | 40 to 80 GHz | 100+ GHz |
| Assembly cost | Low (automated) | Medium (manual) | High (precision) |
Frequently Asked Questions
How does COB reduce RF parasitics?
Eliminates package lead frame (0.5 to 2 nH, 0.1 to 0.5 pF per pin). Wire bonds: 0.3 to 0.7 nH (0.3 to 1 mm length). Flip-chip: 10 to 50 pH, 10 to 30 fF per bump (negligible to 100 GHz). At 28 GHz, 1 nH = 176 Ω reactance, severe mismatch. COB improves gain 3 to 5 dB and extends bandwidth 30 to 50% vs same die in QFN.
What are the thermal advantages?
Direct die attach eliminates package layers. Rth drops from 15 to 40 K/W (QFN) to 3 to 15 K/W (COB). For 5 W PA: 20 to 50°C lower junction temperature. Best: AuSn solder on AlN ceramic (k = 170 W/mK vs FR-4 at 0.3 W/mK). Sintered silver: 200+ W/mK conductivity.
When should COB be used?
Above 10 GHz where package parasitics limit performance. High thermal loads exceeding package capability. Military/aerospace modules on alumina/AlN substrates. Phased array T/R modules (hundreds of die per substrate). Not recommended for: consumer high-volume (<6 GHz), when bare die not available, or when rework is needed.